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Sarcina Technology
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Technology
Package Design
Model Extraction
Simulation
Channel Simulation
Design for Manufacturing
SiP and MCM
56 Gb/s PAM-4
Wafer Probe Card
Final Test Hardware
Test Program Development
Services
Licensing
Technology Available for Licensing
SIMULATION
Differential mode insertion loss
Differential mode return loss
Common mode return loss
Differential mode crosstalk
Differential mode to common mode conversion
Common mode to differential mode conversion
Time domain reflectometer (TDR)
Single mode crosstalk for an entire channel
Loop inductance
